美國ILT2400輻照計配合XSD340AT7探頭可用于測量320~475nm波段、中心波長405nm的輻照度,量程8e-6至60W/cm2,可用于高強度曝光機UV固化工藝測量,以及光阻劑測量、3D打印等監(jiān)測應(yīng)用。關(guān)于美國International Light XSD340AT7 紫外輻照計詳細產(chǎn)品介紹請點擊圖片或網(wǎng)址http://www.oznappies.com/XSD340AT7.html
美國International Light XSD340AT7 紫外輻照計
美國International Light XSD340AT7 紫外輻照計規(guī)格說明文檔下載鏈接地址http://www.oznappies.com/download/201805/ILT2400_XSD340AT7.pdf。(注)點擊鏈接可直接閱讀文檔,或右鍵選擇“另存為”保存到電腦。
HD-10說明書:http://www.oznappies.com/download/202503/Peifbnu_HD-10_UV-VIS.pdf
XSD140B說明書:http://www.oznappies.com/download/201805/ILT2400_XSD140B.pdf
SED254QT說明書:http://www.oznappies.com/download/201805/ILT2400_SED254-QT.pdf
ST-513說明書:http://www.oznappies.com/download/201508/Sentry_ST510-ST512-ST513.pdf
ILT2400-FARUVC說明書:https://www.intl-lighttech.com/products/ilt2400-faruvc-222nm-light-meter